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Elements of a Purpose Built Electron Cryomicroscope for Single-particle CryoEM

Published online by Cambridge University Press:  30 July 2020

Christopher Russo
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, England, United Kingdom
Richard Henderson
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, England, United Kingdom

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Copyright
Copyright © Microscopy Society of America 2020

References

Russo, C.J. and Henderson, R.Charge accumulation in electron cryomicroscopyUltramicroscopy 187, 4349 (2018).10.1016/j.ultramic.2018.01.009CrossRefGoogle ScholarPubMed
Russo, C.J. and Henderson, R.Microscopic charge fluctuations cause minimal contrast loss in cryo-EMUltramicroscopy 187, 5663 (2018).10.1016/j.ultramic.2018.01.011CrossRefGoogle Scholar
Russo, C.J. and Henderson, R.Ewald sphere correction using a single side-band image processing algorithmUltramicroscopy 187, 2633 (2018).10.1016/j.ultramic.2017.11.001CrossRefGoogle ScholarPubMed
Peet, M.J., Henderson, R. & Russo, C.J.The energy dependence of contrast and damage in electron cryomicroscopy of biological moleculesUltramicroscopy 203, 125131 (2019).10.1016/j.ultramic.2019.02.007CrossRefGoogle ScholarPubMed
Naydenova, K., McMullan, G., Peet, M.J., Lee, Y., Edwards, P.C., Chen, S., Leahy, E., Scotcher, S., Henderson, R., Russo, C.J.CryoEM at 100 keV: a demonstration and prospectsIUCrJ 6, 10861098 (2019).10.1107/S2052252519012612CrossRefGoogle ScholarPubMed