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Environmental Scanning Electron Microscopic Study Of Electron Impacted High Explosive Materials

Published online by Cambridge University Press:  01 August 2005

S K Hait ,
B G Polke ,
S Venugopalan ,
B R Gandhe  and
A S Rao
S K Hait
Affiliation:
High Energy Materials Research Laboratory, India
B G Polke
Affiliation:
High Energy Materials Research Laboratory, India
S Venugopalan
Affiliation:
High Energy Materials Research Laboratory, India
B R Gandhe
Affiliation:
High Energy Materials Research Laboratory, India
A S Rao
Affiliation:
High Energy Materials Research Laboratory, India

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2054 - 2055
Copyright
© 2005 Microscopy Society of America