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Essentials of Specimen Preparation for High Performance Volume Imaging by SEM

Published online by Cambridge University Press:  05 August 2019

Thomas J. Deerinck
Thomas J. Deerinck*
Affiliation:
The National Center for Microscopy and Imaging Research, UCSD, La Jolla, California, USA.

Abstract

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Type
Tech Forum Session: Imaging Resin Embedded Samples for Serial Block Face Imaging or Array Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2674 - 2675
Copyright
Copyright © Microscopy Society of America 2019 

References

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[11]Funding for this work was from NIGMS (P41GM103412) to M. Ellisman, NCMIR.Google Scholar