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Exploring Artifact Signals in Atom Probe Mass Spectra

Published online by Cambridge University Press:  04 August 2017

F. Meisenkothen  and
E. B. Steel
F. Meisenkothen
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, U.S.A.
E. B. Steel
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 634 - 635
Copyright
© Microscopy Society of America 2017 

References

[1] Thompson, K., et al, Ultramicroscopy 107 2007). p. 131.CrossRefGoogle Scholar
[2] Saxey, D.W. Ultramicroscopy 111 2011). p. 473.CrossRefGoogle Scholar
[3] Meisenkothen, F., et al, Ultramicroscopy 159 2015). p. 101.CrossRefGoogle Scholar
[4] The authors would like to thank Drs. Ed Oltman, Robert Ulfig, Hugues Francois Saint Cyr, and Ty Prosa of CAMECA, Inc.; Drs. Ann Chiaramonti Debay and Norman Sanford of NIST-Boulder; and Dr. Karen Henry of Intel for their helpful discussions.Google Scholar