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Failure Analysis of Trace Elements and Surfaces Using Hitachi Dedicated STEM

Published online by Cambridge University Press:  05 August 2019

C. Vartuli ,
B. Tracy  and
Jitty Gu
C. Vartuli*
Affiliation:
Hardware Division, FA Group, Apple, Cupertino, CA, USA.
B. Tracy
Affiliation:
Advanced Imaging Group, EAG Laboratories, Sunnyvale, Ca and Raleigh, NC, USA.
Jitty Gu
Affiliation:
Advanced Imaging Group, EAG Laboratories, Sunnyvale, Ca and Raleigh, NC, USA.
*
*Corresponding author: cvartuli@apple.com

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 724 - 725
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zhang, XF, Microscopy Today 19 (2011), p. 26.Google Scholar
[2]Ciston, J et al. , Nature Communications 6 (2015), p. 1.Google Scholar
[3]Howe, J et al. , Microsc. Microanal. 21 (S3) (2015), p. 7358.Google Scholar