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Few-second EELS mapping with atomic-resolution

Published online by Cambridge University Press:  30 July 2021

Berit Goodge  and
Lena Kourkoutis
Berit Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States
Lena Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2704 - 2706
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Hart, , et al. Sci. Rep. 7 (2017), p. 8243.CrossRefGoogle Scholar
Goodge, , et al. (2020) arXiv: 2007.09747.Google Scholar
Goodge, , et al. Microsc. & Microan. S1 (2018).Google Scholar
Goodge, , et al. Microsc. & Microan. S2 (2020).Google Scholar