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Flexible Grid Holder Enabling FIB-SEM Sample Prep and Analysis

Published online by Cambridge University Press:  25 July 2016

C. Hartfield  and
F. Bauer
C. Hartfield
Affiliation:
Oxford Instruments America, Concord, MA, USA
F. Bauer
Affiliation:
Oxford Instruments America, Concord, MA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 162 - 163
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Hartfield, C., et al, Microscopy and Microanalysis 16((Suppl.2 (2010). p. 16.Google Scholar
[2] Hartfield, C., et al, Electronic Device Failure Analysis Magazine 13(3 (2011). p. 18.Google Scholar