Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

N. Rowlands; E.F. Schumacher; A.W. Nicholls

doi:10.1017/S1431927613007368

Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

Published online by Cambridge University Press: 09 October 2013

N. Rowlands ,

E.F. Schumacher and

A.W. Nicholls

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N. Rowlands: Affiliation:
E.F. Schumacher: Affiliation:
A.W. Nicholls: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1074 - 1075

DOI: https://doi.org/10.1017/S1431927613007368 [Opens in a new window]

Article contents

Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

Abstract

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