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The “Great VPSEM Gotcha”: Great VPSEM Imaging Does Not Imply Great VPSEM X-ray Microanalysis! Degraded Spatial Resolution Is Always Imposed by Gas Scattering

Published online by Cambridge University Press:  04 August 2017

Dale E. Newbury  and
Nicholas W. M. Ritchie
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD.
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1090 - 1091
Copyright
© Microscopy Society of America 2017 

References

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[6] Ritchie, N. DTSA-II available free at: www.cstl .nist.gov/div837/837.02/epq/dtsa2/index.html.Google Scholar