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High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.

Published online by Cambridge University Press:  31 July 2006

N Rowlands ,
S von Harrach ,
C Tyrrell  and
F van Uden
N Rowlands
Affiliation:
Oxford Instruments
S von Harrach
Affiliation:
FEI Electron Optics,the Netherlands
C Tyrrell
Affiliation:
Oxford Instruments
F van Uden
Affiliation:
FEI Electron Optics,the Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1364 - 1365
Copyright
© 2006 Microscopy Society of America