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High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?

Published online by Cambridge University Press:  31 July 2006

S Kujawa ,
R Erni ,
B Freitag ,
P Tiemeijer  and
M Stekelenburg
S Kujawa
Affiliation:
FEI Company
R Erni
Affiliation:
FEI Company
B Freitag
Affiliation:
FEI Company
P Tiemeijer
Affiliation:
FEI Company
M Stekelenburg
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1470 - 1471
Copyright
© 2006 Microscopy Society of America