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High-Quality Experimental Data in Electron Microscopy and Microanalysis – What Can, and Should We Jointly Do?

Published online by Cambridge University Press:  05 August 2019

Vasile-Dan Hodoroaba
Vasile-Dan Hodoroaba*
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division 6.1 Surface Analysis and Interfacial Chemistry, Berlin, Germany.

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1762 - 1763
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]ISO/IEC 17025 ISO, Geneve (2005).Google Scholar
[2]Technical Committees / ISO/TC 202 Microbeam analysis http://www.iso.orgGoogle Scholar
[3]http://www.bipm.org/en/committees/cc/ccqm/.Google Scholar
[4]Hodoroaba, V-D et al. , Microsc. Microanal. 20 (S3) (2014), p. 730.Google Scholar
[5]ISO/IEC Guide 98-3:2008 (GUM:1995), Geneva: Internat. Org. Stds.Google Scholar
[6]Technical Working Area TWA 37 Quantitative Microstructural Analysis, http://www.vamas.org/Google Scholar