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Holographic Phase Imaging of Charged Threading Dislocation in 4H-SiC

Published online by Cambridge University Press:  01 August 2010

S Chung ,
MR McCartney ,
R Berechman ,
Y Picard  and
M Skowronski
S Chung
Affiliation:
Carnegie Mellon University
MR McCartney
Affiliation:
Arizona State University
R Berechman
Affiliation:
Carnegie Mellon University
Y Picard
Affiliation:
Carnegie Mellon University
M Skowronski
Affiliation:
Carnegie Mellon University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 564 - 565
Copyright
Copyright © Microscopy Society of America 2010