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Image Formation in Femtosecond Confocal Interference Microscopy

Published online by Cambridge University Press:  28 July 2005

Min Gu
Min Gu
Affiliation:
Optoelectronic Imaging Group, Department of Applied Physics, Victoria University of Technology, P.O. Box 14428, MCMC, Victoria 8001, Australia
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Abstract

Three-dimensional image formation in an interference confocal scanning microscope under ultra-short pulsed beam illumination is investigated in this study. The novelty of this new image system is that it keeps advantages in femtosecond interferometry but also provides a femtosecond-resolved three-dimensional image without necessarily using an ultrafast detector. For a 5-fs pulsed beam illumination, spatial resolution in the axial and transverse directions in this system is improved by approximately 45% and 15%, respectively, compared with that in the case of continuous wave illumination. However, strong chromatic aberration caused by an ultrashort pulsed beam can result in a degradation of spatial and temporal resolution, whereas weak chromatic aberration may lead to an improvement in transverse resolution.

Keywords

confocal microscopyultrashort pulsed beam illuminationtransfer functionchromatic aberrationinterference imaging
Type
Research Article
Information
Microscopy and Microanalysis , Volume 4 , Issue 1 , February 1998 , pp. 63 - 71
Copyright
© 2005 Microscopy Society of America

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