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Imaging Atomic Dynamics in 2D Silica Glass with Low-Voltage Aberration-Corrected TEM

Published online by Cambridge University Press:  09 October 2013

P.Y. Huang ,
J.S. Alden ,
S. Kurasch ,
A. Shekhawat ,
A.A. Alemi ,
J.P. Sethna ,
U. Kaiser  and
D.A. Muller
P.Y. Huang
Affiliation:
J.S. Alden
Affiliation:
S. Kurasch
Affiliation:
A. Shekhawat
Affiliation:
A.A. Alemi
Affiliation:
J.P. Sethna
Affiliation:
U. Kaiser
Affiliation:
D.A. Muller
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1224 - 1225
Copyright
Copyright © Microscopy Society of America 2013