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Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode

Published online by Cambridge University Press:  02 April 2014

Artur Zieliński Open the ORCID record for Artur Zieliński [Opens in a new window]  and
Kazimierz Darowicki
Artur Zieliński*
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Chemical Faculty, Gdańsk University of Technology, Narutowicza St. 11/12, 80-233 Gdańsk, Poland
Kazimierz Darowicki
Affiliation:
Department of Electrochemistry, Corrosion and Materials Engineering, Chemical Faculty, Gdańsk University of Technology, Narutowicza St. 11/12, 80-233 Gdańsk, Poland
*
*Corresponding author.ziela@chem.pg.gda.pl
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Abstract

This study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of traditional impedance measurement related to sequential changes in system perturbation compared with the sine wave superposition type.

Keywords

atomic force microscopynanoimpedance microscopynanoimpedance spectroscopymultisnusiodal impedance spectroscopyfast impedance measurements
Type
Techniques and Instrumentation Development
Information
Microscopy and Microanalysis , Volume 20 , Issue 3 , June 2014 , pp. 974 - 981
Copyright
© Microscopy Society of America 2014 

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