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Improved ATR Infrared Microanalysis of Thin Multilayered Samples and Included Small Particles

Published online by Cambridge University Press:  01 August 2005

T J Tague Jr  and
G Hall
T J Tague Jr
Affiliation:
Bruker Optics Inc., Billerica, Massachusetts
G Hall
Affiliation:
Rutgers University, New Brunswick, New Jersey

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 474 - 475
Copyright
© 2005 Microscopy Society of America