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Improved Performance of a Commercial SDD for X-ray Microanalysis

Published online by Cambridge University Press:  26 July 2009

E Kenik
E Kenik*
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 560 - 561
Copyright
Copyright © Microscopy Society of America 2009