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In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

Published online by Cambridge University Press:  01 August 2003

Y. Homma
Y. Homma*
Affiliation:
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 910 - 911
Copyright
Copyright © Microscopy Society of America 2003