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In Situ TEM Observation of AlGaN/GaN HEMTs Under Applied DC Bias

Published online by Cambridge University Press:  08 April 2017

A Lang ,
C Winkler ,
J Sloppy ,
C Johnson  and
M Taheri
A Lang
Affiliation:
Drexel University
C Winkler
Affiliation:
Drexel University
J Sloppy
Affiliation:
Drexel University
C Johnson
Affiliation:
Drexel University
M Taheri
Affiliation:
Drexel University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 502 - 503
Copyright
Copyright © Microscopy Society of America 2011