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In Situ TEM Straining of Ultrafine-grained Aluminum Films of Different Textures Using Automated Crystal Orientation Mapping.

Published online by Cambridge University Press:  25 July 2016

Ehsan Izadi ,
Amith Darbal ,
Pedro Peralta  and
Jagannathan Rajagopalan
Ehsan Izadi
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA
Amith Darbal
Affiliation:
AppFive LLC, Tempe, Arizona, USA
Pedro Peralta
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA
Jagannathan Rajagopalan
Affiliation:
Department of Mechanical and Aerospace Engineering School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1950 - 1951
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rajagopalan, J. & Saif, T. A. Journal of Materials Research 26 (2011). p. 2826–2832.CrossRefGoogle Scholar
[2] Izadi, E. & Rajagopalan, J. Scripta Materialia 114 (2016). p. 65–69.Google Scholar
[3] Han, J. & Saif, M. Review of Scientific Instruments 77 (2007). p. 045102.CrossRefGoogle Scholar
[4] The authors acknowledge the use of facilities at the John M. Cowley Centre for High Resolution Electron Microscopy and the Centre for Solid State Electronics Research at Arizona State University.Google Scholar