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In-situ Imaging of Anisotropic Layer-by-layer Phase Transition in Few-layer MoTe2

Published online by Cambridge University Press:  22 July 2022

Chia-Hao Lee ,
Huije Ryu ,
Gillian Nolan ,
Yichao Zhang ,
Yangjin Lee ,
Kwanpyo Kim ,
Gwan-Hyoung Lee  and
Pinshane Y. Huang
Chia-Hao Lee
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Huije Ryu
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Korea
Gillian Nolan
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Yichao Zhang
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Yangjin Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea
Kwanpyo Kim
Affiliation:
Department of Physics, Yonsei University, Seoul, Korea
Gwan-Hyoung Lee
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Korea
Pinshane Y. Huang*
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, USA
*
*Corresponding author: pyhuang@illinois.edu

Abstract

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Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2320 - 2322
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Copyright
Copyright © Microscopy Society of America 2022

References

Sankar, R. et al. , Chem. Mater. 29 (2017), p. 699-70710.1021/acs.chemmater.6b04363CrossRefGoogle Scholar
Song, S. et al. , Nano Lett. 16 (2015), p. 188-19310.1021/acs.nanolett.5b03481CrossRefGoogle Scholar
Keum, D. H. et al. , Nat. Phys. 11 (2015), p. 482-48610.1038/nphys3314CrossRefGoogle Scholar
Ryu, H. et al. , Adv. Funct. Mater. (2021), p. 2107376Google Scholar
This work was supported by the DOE award number DE-SC0020190. This work was carried out in part in the Materials Research Laboratory at UIUC.Google Scholar