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In-situ TEM Study of Optical and Mechanical Effects on Electrical Properties of CuO Nanowires

Published online by Cambridge University Press:  09 October 2013

S.J. Kim ,
J.R. Jokisaari ,
A. Kargar ,
D. Wang  and
X. Pan
S.J. Kim
Affiliation:
J.R. Jokisaari
Affiliation:
A. Kargar
Affiliation:
D. Wang
Affiliation:
X. Pan
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1496 - 1497
Copyright
Copyright © Microscopy Society of America 2013