Hostname: page-component-76dd75c94c-t6jsk Total loading time: 0 Render date: 2024-04-30T09:48:38.870Z Has data issue: false hasContentIssue false

In-situThermal Testing on Nanostructures in TEM

Published online by Cambridge University Press:  25 July 2016

Hua Guo
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA
Will J. Hardy
Affiliation:
Applied Physics Graduate Program, Smalley-Curl Institute, Rice University, Houston, Texas, USA
Panpan Zhou
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Douglas Natelson
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Jun Lou
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Hobbs, L.W. in “Introduction to Analytical Electron Microscopy”. Plenum (1979).Google Scholar
[2] Gao, Y. & Bando, Y. Nature 415 (2002). p. 599.CrossRefGoogle Scholar
[3] Brintlinger, T., Qi, Y., Baloch, K.H., Goldhaber-Gordon, D. & Cumings, J. Nano Lett. 8 (2008). p. 582.CrossRefGoogle Scholar
[4] Shi, L., et al., J. Appl. Phys. 105 (2009). p. 104306.CrossRefGoogle Scholar
[5] Mecklenburg, M., et al., Science 347 (2015). p. 629.CrossRefGoogle Scholar
[6] Eyert, V. Annalen der Physik 11 (2002). p. 650.CrossRefGoogle Scholar
[7] Guo, H., et al., Appl. Phys. Lett 102 (2013). p. 231909.CrossRefGoogle Scholar