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Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM

Published online by Cambridge University Press:  01 August 2010

K van Benthem ,
CS Bonifacio ,
AM Thron ,
SM Weil  and
TB Holland
K van Benthem
Affiliation:
University of California, Davis
CS Bonifacio
Affiliation:
University of California, Davis
AM Thron
Affiliation:
University of California, Davis
SM Weil
Affiliation:
University of California, Davis
TB Holland
Affiliation:
University of California, Davis

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1750 - 1751
Copyright
Copyright © Microscopy Society of America 2010