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Large Area Silicon Drift Detectors for EDS in Microbeam Analysis

Published online by Cambridge University Press:  01 August 2005

H Soltau ,
P Lechner ,
G Lutz ,
A Niculae ,
L Strüder ,
C Fiorini ,
A Longoni ,
R Eckhard ,
G Schaller  and
F Schopper
H Soltau
Affiliation:
PNSensor GbmH, München, Germany
P Lechner
Affiliation:
PNSensor GbmH, München, Germany
G Lutz
Affiliation:
PNSensor GbmH, München, Germany
A Niculae
Affiliation:
PNSensor GbmH, München, Germany
L Strüder
Affiliation:
MPI Halbleiterlabor, München, Germany
C Fiorini
Affiliation:
Politecnico di Milano, Italy
A Longoni
Affiliation:
Politecnico di Milano, Italy
R Eckhard
Affiliation:
PNSensor GbmH, München, Germany
G Schaller
Affiliation:
MPI Halbleiterlabor, München, Germany
F Schopper
Affiliation:
MPI Halbleiterlabor, München, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 456 - 457
Copyright
© 2005 Microscopy Society of America