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Large Solid Angle 50 mm2 SDD for TEM Applications

Published online by Cambridge University Press:  01 August 2010

S Barkan ,
VD Saveliev ,
NJ Zaluzec ,
CR Tull ,
L Feng  and
M Takahashi
S Barkan
Affiliation:
SII NanoTechnology USA Inc.
VD Saveliev
Affiliation:
SII NanoTechnology USA Inc.
NJ Zaluzec
Affiliation:
Argonne National Laboratory
CR Tull
Affiliation:
SII NanoTechnology USA Inc.
L Feng
Affiliation:
SII NanoTechnology USA Inc.
M Takahashi
Affiliation:
SII NanoTechnology USA Inc.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1316 - 1317
Copyright
Copyright © Microscopy Society of America 2010