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Machine-Learning Assisted Exit-wave Reconstruction for Quantitative Feature Extraction

Published online by Cambridge University Press:  22 July 2022

Matthew Helmi Leth Larsen ,
Frederik Dahl ,
David Christoffer Bisp Nielsen ,
Lars Pilsgaard Hansen ,
Bastian Barton ,
Christian Kisielowski ,
Ole Winther ,
Thomas W. Hansen ,
Stig Helveg  and
Jakob Schiøtz
Matthew Helmi Leth Larsen
Affiliation:
Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Frederik Dahl
Affiliation:
Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
David Christoffer Bisp Nielsen
Affiliation:
Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Lars Pilsgaard Hansen
Affiliation:
Haldor Topsøe A/S, Haldor Topsøes Allé 1, DK-2800 Kgs. Lyngby, Denmark
Bastian Barton
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Road, CA Berkeley, USA
Christian Kisielowski
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Road, CA Berkeley, USA
Ole Winther
Affiliation:
Department of Mathematics and Computer Science, Technical University of Denmark, Kgs. Lyngby, Denmark
Thomas W. Hansen
Affiliation:
National Center for Nano Fabrication and Characterization, Technical University of Denmark, Kgs. Lyngby, Denmark
Stig Helveg
Affiliation:
Center for Visualizing Catalytic Processes (VISION), DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Jakob Schiøtz*
Affiliation:
Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
*
*Corresponding author: schiotz@fysik.dtu.dk

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2222 - 2224
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Copyright
Copyright © Microscopy Society of America 2022

References

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