Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-29T06:12:10.295Z Has data issue: false hasContentIssue false
  • English
  • Français

Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM

Published online by Cambridge University Press:  30 July 2021

Ute Golla-Schindler ,
Irene Wacker ,
Bernd Schindler ,
Ralf Löffler ,
Dagmar Goll ,
Gerhard Schneider  and
Rasmus R. Schröder
Ute Golla-Schindler
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Germany
Irene Wacker
Affiliation:
2. Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany, United States
Bernd Schindler
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany, United States
Ralf Löffler
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Dagmar Goll
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Gerhard Schneider
Affiliation:
1. Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Rasmus R. Schröder
Affiliation:
2. Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3134 - 3136
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Böngeler, R. et al. , Scanning 15 (1993) p. 1-18Google Scholar
Schröder, R.R. et al. , Microscopy and Microanalysis 24 (2018) p. 626Google Scholar
Golla-Schindler, U. et al. , Microscopy and Microanalysis 25 (2019) p. 448CrossRefGoogle Scholar
Golla-Schindler, U. et al. , Micron 113 (2018) p. 10-19Google Scholar
We thank the Centre for Advanced Materials and ZEISS GmbH for the DELTA images. I. Wacker is member and R,R. Schröder is PI of the Cluster of Excellence “3D Matter Made to Order” (EXC-2082/1 – 390761711) under Germany's Excellence Strategy.Google Scholar