Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-17T16:27:32.296Z Has data issue: false hasContentIssue false
  • English
  • Français

Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials

Published online by Cambridge University Press:  23 September 2015

Y Zhu ,
H Katz-Boon ,
CL Zheng ,
M Walsh ,
C Dwyer ,
L Bourgeois ,
R Withers  and
J Etheridge
Y Zhu
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia
H Katz-Boon
Affiliation:
Department of Materials Engineering, Monash University, Victoria 3800, Australia
CL Zheng
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
M Walsh
Affiliation:
Department of Materials Engineering, Monash University, Victoria 3800, Australia
C Dwyer
Affiliation:
Ernst Ruska-Centre, Peter Gruenberg Inst, Forschungszentrum Juelich, D-52425 Juelich, Germany
L Bourgeois
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
R Withers
Affiliation:
Research School of Chemistry, Australian National University, ACT 0200, Australia
J Etheridge
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2415 - 2416
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Maunders, C, Dwyer, C, Tiemeijer, P & Etheridge, J, Ultramicroscopy 111 (2011) 1437.Google Scholar
[2] Dwyer, C, Maunders, C, Zheng, C L, Weyland, M, Tiemeijer, P & Etheridge, J., App Phys Lett 100 (2012).Google Scholar
[3] Zheng, C L & Etheridge, J, Ultramicroscopy 125 (2013) 49.CrossRefGoogle Scholar
[4] Katz-Boon, H, et al., Nano Letts just accepted (2015). DOI: 10.1021/acs.nanolett.5b00124.Google Scholar
[5] Erni, R, et al. Nat. Mater. 13 (2014) 216 ; B Guiton & P Davies Nat. Mater. 13 (2014) 217.Google Scholar
[6] Zhu, Y, Withers, R, Bourgeois, L, Dwyer, C & Etheridge, J submitted 2015.Google Scholar
[7] Kauko, H, Zheng, CL, Zhu, Y, et al., App Phys Letts 103 (2013) 232111.Google Scholar
[8] Jiang, N, Gao, Q, Parkinson, P, Wong-Leung, J, et al., Nano Lett 13 (2013) 5135.Google Scholar
[9] Funding is acknowledged from the Australian Research Council Grants DP110104734, DP120101573, LE0454166. We thank A. Funston, P. Mulvaney and C. Jagadish for specimens.Google Scholar