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Measurement of Charge at Grain-boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography

Published online by Cambridge University Press:  21 July 2003

M. A. Schofield ,
M. Beleggia ,
Y. Zhu ,
K. Guth  and
Ch. Jooss
M. A. Schofield
Affiliation:
Department of Materials Science, Brookhaven National Laboratory, Upton, Long Island NY 11973
M. Beleggia
Affiliation:
Department of Materials Science, Brookhaven National Laboratory, Upton, Long Island NY 11973
Y. Zhu
Affiliation:
Department of Materials Science, Brookhaven National Laboratory, Upton, Long Island NY 11973
K. Guth
Affiliation:
University of Göttingen, Windausweg 2, 37073 Göttingen, Germany
Ch. Jooss
Affiliation:
University of Göttingen, Windausweg 2, 37073 Göttingen, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 784 - 785
Copyright
Copyright © Microscopy Society of America 2003