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Measurements of Functional Response of Nano-objects using Advanced Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

Y Zhu ,
T Beetz ,
L Wu ,
R Klie ,
L Huang ,
JW Lau ,
MA Schofield ,
VV Volkov ,
M Beleggia  and
M Malac
Y Zhu
Affiliation:
Brookhaven National Laboratory
T Beetz
Affiliation:
Brookhaven National Laboratory
L Wu
Affiliation:
Brookhaven National Laboratory
R Klie
Affiliation:
Brookhaven National Laboratory
L Huang
Affiliation:
Brookhaven National Laboratory
JW Lau
Affiliation:
Brookhaven National Laboratory
MA Schofield
Affiliation:
Brookhaven National Laboratory
VV Volkov
Affiliation:
Brookhaven National Laboratory
M Beleggia
Affiliation:
Brookhaven National Laboratory
M Malac
Affiliation:
National Institute for Nanotechnology,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 540 - 541
Copyright
© 2006 Microscopy Society of America