Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-05-18T11:30:22.342Z Has data issue: false hasContentIssue false
  • English
  • Français

Misfit Dislocations in Ferroelectric Thin films

Published online by Cambridge University Press:  03 August 2008

M Arredondo ,
M Chi ,
M Saunders ,
A Petraru ,
V Nagarajan ,
H Kohlstedt  and
ND Browning
M Arredondo
Affiliation:
University of New South Wales, Australia
M Chi
Affiliation:
University of California, Davis
M Saunders
Affiliation:
University of Western Australia
A Petraru
Affiliation:
Institut für Festkörperforschung, Germany
V Nagarajan
Affiliation:
University of New South Wales, Australia
H Kohlstedt
Affiliation:
Institut für Festkörperforschung, Germany
ND Browning
Affiliation:
University of California, Davis
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 240 - 241
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)