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The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

Published online by Cambridge University Press:  01 August 2018

Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland
Clive Downing
Affiliation:
Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin, Ireland

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Jones, L. IOP Conf. Ser. Mater. Sci. Eng. 109 2016) p. 12008.Google Scholar
[2] Kirkland, E. J. Thomas, M. G. Ultramicroscopy 62 1996) p. 79.Google Scholar
[3] Krause, F. F., et al, Ultramicroscopy 161 2016) p. 146.Google Scholar
[4] Sang, X. LeBeau, J. M. Ultramicroscopy 161 2016) p. 3.Google Scholar
[5] Buban, J. P., et al, J. Electron Microsc. (Tokyo) 59 2010) p. 103.Google Scholar
[6] Ishikawa, R., Luprni, A. R., Findlay, S. D. Pennycook, S. J. Microsc. Microanal. 20 2014) p. 99.Google Scholar
[7] Macarthur, K. E., Jones, L. B. Nellist, P. D. J. Phys. Conf. Ser 522 2014.Google Scholar