Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-05-27T02:50:10.904Z Has data issue: false hasContentIssue false
  • English
  • Français

The Nanolathe - a Dedicated Two-axis Positioner for Concentric Sample Rotation.

Published online by Cambridge University Press:  25 July 2016

A. J. Smith ,
Klaus Schock ,
Stephan Kleindiek  and
Stephan Gerstl
A. J. Smith
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Klaus Schock
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Stephan Kleindiek
Affiliation:
Kleindiek Nanotechnik, Reutlingen, Germany
Stephan Gerstl
Affiliation:
ScopeM, ETH Zurich, Switzerland

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 686 - 687
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Martin Dierolf, Andreas, Menzel, Pierre, Thibault, Philipp, Schneider, Cameron M., Kewish, Roger, Wepf, Oliver Bunk & Franz, Pfeiffer Nature 467, 436–439, 23 September 2010 10.1038/nature09419.CrossRefGoogle Scholar