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Nano-scale 3-D Characterization of Materials Using FIB-SEM

Published online by Cambridge University Press:  31 July 2006

K Dovidenko ,
D Ellis ,
J Grande  and
RA Potyrailo
K Dovidenko
Affiliation:
General Electric Global Research Center
D Ellis
Affiliation:
General Electric Global Research Center
J Grande
Affiliation:
General Electric Global Research Center
RA Potyrailo
Affiliation:
General Electric Global Research Center

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1238 - 1239
Copyright
© 2006 Microscopy Society of America