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NETSEM Collaborator - an Application in Telemicroscopy

Published online by Cambridge University Press:  02 July 2020

B.C. Breton
Affiliation:
Department of Engineering, University of Cambridge, Cambridge, CB2 1PZ, United Kingdom
G. Chand
Affiliation:
LEO Electron Microscopy Ltd., Clifton Road, Cambridge, CB1 3QH, United Kingdom
P.J. Howard
Affiliation:
ERA Technology Ltd., Cleeve Road, Leatherhead, Surrey, KT22 7SA, United Kingdom
N.H.M. Caldwell
Affiliation:
Department of Engineering, University of Cambridge, Cambridge, CB2 1PZ, United Kingdom
D.M. Holburn
Affiliation:
Department of Engineering, University of Cambridge, Cambridge, CB2 1PZ, United Kingdom
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Extract

Telemicroscopy, sometimes called remote microscopy, is an expanding set of microscopy techniques, made possible by the advent of ubiquitous and pervasive Internet technologies such as the World Wide Web. Recently, telemicroscopy has moved from laboratory prototypes to commercially available software. This paper discusses a real-world application of telemicroscopy in terms of a microscopy consultancy service offered by ERA Technology Ltd. in Leatherhead, UK.

Many organisations require microscopical services on an occasional basis. These needs are not however, sufficiently frequent as to justify the purchase and upkeep of an SEM or the recruitment and retention of a trained instrument operator Such organisations employ consultancy firms to perform the required analyses. In many such consultancies, a sample is sent to the microscopist with appropriate instructions. Once the investigation is complete, the consultant returns sample, micrographs and other results. The SEM service run by ERA has always offered its customers the opportunity for personal participation in any investigation, by attendance at SEM sessions at the Leatherhead laboratory.

Type
Scanning Electron Microscopy
Copyright
Copyright © Microscopy Society of America

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References

1.Chand, G.et al., Scanning: The Journal of Scanning Microscopies, (1997), Vol 19, 4, 292296.CrossRefGoogle Scholar
2.Breton, B.C.et al., Microscopy & Analysis, September (1997), 1921.Google Scholar
3.Caldwell, N.H.M.et al., Electron Microscopy and Analysis 1997, 5356.Google Scholar
4. This work was supported by LEO Electron Microscopy Ltd., the Isaac Newton Trust, and ERA Technology Ltd.Google Scholar