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A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level

Published online by Cambridge University Press:  31 July 2006

M Van der Stam ,
R Erni ,
S Kujawa ,
P Tiemeijer ,
M Stekelenburg  and
B Freitag
M Van der Stam
Affiliation:
FEI Company,The Netherlands
R Erni
Affiliation:
FEI Company,The Netherlands
S Kujawa
Affiliation:
FEI Company,The Netherlands
P Tiemeijer
Affiliation:
FEI Company,The Netherlands
M Stekelenburg
Affiliation:
FEI Company,The Netherlands
B Freitag
Affiliation:
FEI Company,The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1372 - 1373
Copyright
© 2006 Microscopy Society of America