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New Low Voltage Scanning Transmission Electron Microscope Detector for Fastest Image Acquisition in BF, DF and HAADF

Published online by Cambridge University Press:  09 October 2013

R. Salzer ,
J. Ackermann ,
R. Arnold ,
S. Meyer  and
C. Kübler
R. Salzer
Affiliation:
J. Ackermann
Affiliation:
R. Arnold
Affiliation:
S. Meyer
Affiliation:
C. Kübler
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1182 - 1183
Copyright
Copyright © Microscopy Society of America 2013