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New Results from SDD Detectors with Minimized Input Capacitance

Published online by Cambridge University Press:  23 November 2012

J. Treis ,
R. Eckhardt ,
S. Jeschke ,
L. Mungenast ,
H. Soltau ,
K. Heinzinger ,
K. Hermenau ,
G. Krenz ,
P. Lechner  and
G. Lutz
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J. Treis
Affiliation:
PNDetector GmbH, Munich, Germany
R. Eckhardt
Affiliation:
PNDetector GmbH, Munich, Germany
S. Jeschke
Affiliation:
PNDetector GmbH, Munich, Germany
L. Mungenast
Affiliation:
PNDetector GmbH, Munich, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Munich, Germany
K. Heinzinger
Affiliation:
PNSensor GmbH, Munich, Germany
K. Hermenau
Affiliation:
PNSensor GmbH, Munich, Germany
G. Krenz
Affiliation:
PNSensor GmbH, Munich, Germany
P. Lechner
Affiliation:
PNSensor GmbH, Munich, Germany
G. Lutz
Affiliation:
PNSensor GmbH, Munich, Germany
F. Schopper
Affiliation:
MPI Semiconductor Laboratory, Munich, Germany
L. Strüder
Affiliation:
MPI Semiconductor Laboratory, Munich, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1224 - 1225
Copyright
Copyright © Microscopy Society of America 2012

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