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A Novel Method for Automated Acquisition of Tilt Series for Electron Tomography Based on Pre-Calibration of the Specimen Stage

Published online by Cambridge University Press:  02 July 2020

U. Ziese ,
A.H. Janssen ,
T.P. van der Krift ,
A.G. van Balen ,
W.J. de Ruijter  and
A.J. Roster
U. Ziese
Affiliation:
Department of Molecular Cell Biology, Utrecht University, 3584, CH, Utrecht, The Netherlands
A.H. Janssen
Affiliation:
Department of Molecular Cell Biology, Utrecht University, 3584, CH, Utrecht, The Netherlands
T.P. van der Krift
Affiliation:
Department of Molecular Cell Biology, Utrecht University, 3584, CH, Utrecht, The Netherlands
A.G. van Balen
Affiliation:
FEI Electron Optics, 5600, MD, Eindhoven, The Netherlands
W.J. de Ruijter
Affiliation:
Emispec Systems, Inc., Tempe, AZ85282, USA
A.J. Roster
Affiliation:
Department of Molecular Cell Biology, Utrecht University, 3584, CH, Utrecht, The Netherlands
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Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. Conventional TEM images are in first approximation mere 2D-projections of a 3D sample under investigation. With electron tomographya series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments (so called tilt-series). For the subsequent 3D-reconstruction, the images of the tilt series are aligned relative to each other and the 3D-reconstruction is computed. Electron tomography is the only technique that can provide true 3D information with nm-scale resolution of individual and unique samples. For (cell) biology and material science applications the availability of high-resolution 3D images of structural arrangements within individual samples provides unique architectural information that cannot be obtained otherwise. Routine application of electron tomography will comprise a major revolutionary step forward in the characterization of complex materials and cellular arrangements.

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Instrument Performance
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1148 - 1149
Copyright
Copyright © Microscopy Society of America

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References

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