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Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies

Published online by Cambridge University Press:  25 July 2016

Joesph A. Peoples ,
Brandom M. Howe ,
Lawrence Grazulis  and
Krishnamurthy Mahalingam
Joesph A. Peoples
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, USA
Brandom M. Howe
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, USA
Lawrence Grazulis
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, USA
Krishnamurthy Mahalingam
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 176 - 177
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Howe, B.M., Emori, S., Hyung-Min, Jeon, Oxholm, T.M., Jones, J.G., Mahalingam, K., Yan, Zhuang, Sun, N.X. & Brown, G.J. Magnetics Letters, IEEE 6, 1 (2015).CrossRefGoogle Scholar
[2] Mayer, Joachim, Giannuzzi, Lucille A., Kamino, Takeo & Michael, Joseph MRS Bulletin 32, 400 (2007).Google Scholar
[3] Work at the National Center for Electron Microscopy, Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar