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Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

Christopher R Perrey ,
Julia M Deneen ,
Siri S Thompson ,
Markus Lentzen ,
Uwe Kortshagen  and
C. Barry Carter
Christopher R Perrey
Affiliation:
University of Minnesota
Julia M Deneen
Affiliation:
University of Minnesota
Siri S Thompson
Affiliation:
University of Minnesota
Markus Lentzen
Affiliation:
Institute for Solid State Research Jülich, Germany
Uwe Kortshagen
Affiliation:
University of Minnesota
C. Barry Carter
Affiliation:
University of Minnesota
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 996 - 997
Copyright
© 2004 Microscopy Society of America

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