Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-06-02T06:34:12.537Z Has data issue: false hasContentIssue false
  • English
  • Français

On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images

Published online by Cambridge University Press:  04 August 2017

Jason Holm  and
Ryan White
Jason Holm
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.
Ryan White
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 600 - 601
Copyright
© Microscopy Society of America 2017 

References

[1] Morandi, V. & Merli, P. J. Appl. Phys 101 2007 114917.Google Scholar
[2] Holm, J. & Keller, R. Ultramicroscopy 167 2016 43–56.Google Scholar
[3] This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar