Hostname: page-component-76fb5796d-wq484 Total loading time: 0 Render date: 2024-04-26T05:09:42.080Z Has data issue: false hasContentIssue false
  • English
  • Français

A Portable Endstation for Analytical X-ray Microscopy Using Soft X-ray Synchrotron Radiation

Published online by Cambridge University Press:  10 August 2018

Andreas Haidl ,
Urs Wiesemann ,
Konstantin Andrianov ,
Lars Lühl ,
Thomas Nisius ,
Aurelie Dehlinger ,
Hanna Dierks ,
Birgit KanngieBer  and
Thomas Wilhein
Andreas Haidl*
Affiliation:
Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus Remagen, Germany
Urs Wiesemann
Affiliation:
Axilon AG, Cologne, Germany
Konstantin Andrianov
Affiliation:
Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus Remagen, Germany
Lars Lühl
Affiliation:
Institute for Optics and Atomic Physics, Technical University Berlin, Germany
Thomas Nisius
Affiliation:
Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus Remagen, Germany
Aurelie Dehlinger
Affiliation:
Institute for Optics and Atomic Physics, Technical University Berlin, Germany
Hanna Dierks
Affiliation:
Institute for Optics and Atomic Physics, Technical University Berlin, Germany
Birgit KanngieBer
Affiliation:
Institute for Optics and Atomic Physics, Technical University Berlin, Germany
Thomas Wilhein
Affiliation:
Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus Remagen, Germany
*
*haidl@hs-koblenz.de

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 230 - 231
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Kirz, J., et al, Q. Rev. Biophys. 1995 28(1), 33–130.Google Scholar
[2] Viefhaus, J., et al, Nucl. Instr. Meth. Phys. Res 710(203 151-154.Google Scholar
[3] Wessels, P., et al, J. Phys.: Conf. Ser. 499 2014 012009.Google Scholar
[4] Andrianov, K., et al, J. Phys.: Conf. Ser. 849 2017 012007.Google Scholar
[5] This project is financially supported by the Federal Ministry for Education and Research (BMBF) under the joint project code 05K2016. Parts of this research were carried out at PETRA III at DESY.Google Scholar