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Potential of Application Focused Ion Beam in Forensic Science Area

Published online by Cambridge University Press:  04 August 2017

Marek Kotrly
Marek Kotrly*
Affiliation:
Institute of Criminalistics Prague (ICP), Czech Republic; Charles University in Prague, Faculty of Science, Praha, Czech Republic.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 256 - 257
Copyright
© Microscopy Society of America 2017 

References

[1] Kotrly, M., Mares, B., Turkova, I. & Beroun, I. Proc. SPIE 9823, (2016), p. 98230S-1 - 9.Google Scholar
[2] Kotrly, M. & Turkova, I. Proc. SPIE 9486, 2015, Vol. 9486, (2015), p. 948614-1 - 11.Google Scholar
[3] Kotrly, M. Microsc. Microanal 22(Suppl 3 2016). p. 2032.Google Scholar
[4] Acknowledgements - Microanalytical methods at ICP has been supported by the projects of the Ministry of the Interior of the Czech Republic: VG20102015065, VF20112015016, VI20152020004, VI20152020035, VI20172020050.Google Scholar