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Probe Shaping for Quantitative DPC-STEM Using Segmented Detectors

Published online by Cambridge University Press:  01 August 2018

L. Clark ,
H.G. Brown ,
D.M. Paganin ,
M.J. Morgan ,
T. Matsumoto ,
N. Shibata ,
T.C. Petersen  and
S.D. Findlay
L. Clark
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
H.G. Brown
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
D.M. Paganin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
M.J. Morgan
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
T. Matsumoto
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
N. Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
T.C. Petersen
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
S.D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 916 - 917
Copyright
© Microscopy Society of America 2018 

References

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[10] This research was supported by the Australian Research Council Discovery Projects funding scheme (Project DP160102338). N.S. acknowledges support from SENTAN, JST and JSPS KAKENHI Grant numbers JP26289234 and JP17H01316. The GaAs p-n junction samples were provided by Hirokazu Sasaki, Furukawa Electric Co., Ltd.Google Scholar