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Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method

Published online by Cambridge University Press:  25 July 2016

Eiji Okunishi  and
Yukihito Kondo
Eiji Okunishi
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 264 - 265
Copyright
© Microscopy Society of America 2016 

References

References:

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