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Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy

Published online by Cambridge University Press:  10 August 2018

Xinying Shi ,
Marko Huttula ,
Vladimir Pankratov ,
Joanna Hoszowska ,
Jean-Claude Dousse ,
Faisal Zeeshan ,
Yuran Niu ,
Alexei Zakharov ,
Zhongjia Huang  and
Gang Wang
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Xinying Shi*
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Marko Huttula
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Vladimir Pankratov
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Joanna Hoszowska
Affiliation:
Department of Physics, University of Fribourg, Ch. du Musee 3, CH-1700Fribourg, Switzerland.
Jean-Claude Dousse
Affiliation:
Department of Physics, University of Fribourg, Ch. du Musee 3, CH-1700Fribourg, Switzerland.
Faisal Zeeshan
Affiliation:
Department of Physics, University of Fribourg, Ch. du Musee 3, CH-1700Fribourg, Switzerland.
Yuran Niu
Affiliation:
MAX IV Laboratory, Lund University, P.O. Box 118, 22100, Lund, Sweden.
Alexei Zakharov
Affiliation:
MAX IV Laboratory, Lund University, P.O. Box 118, 22100, Lund, Sweden.
Zhongjia Huang
Affiliation:
School of Mechanical and Automotive Engineering, Anhui Polytechnic University, Wuhu, China.
Gang Wang
Affiliation:
School of Mechanical and Automotive Engineering, Anhui Polytechnic University, Wuhu, China.
Sergei Posysaev
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Olga Miroshnichenko
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Matti Alatalo
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
Wei Cao
Affiliation:
Nano and Molecular Systems Research Unit, University of Oulu, FI-90014, Oulu, Finland.
*
*Corresponding author, xinying.shi@oulu.fi

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 458 - 459
Copyright
© Microscopy Society of America 2018 

References

[1] Allain, A., et al, Nat. Mater. 14 2015) p. 1195.Google Scholar
[2] Kappera, R., et al, Nat. Mater. 13 2014) p. 1128.Google Scholar
[3] Leong, W. S., et al, ACS Nano 9 2015) p. 869.Google Scholar
[4] Shi, X., et al, Small 14 2018 1704526.Google Scholar
[5] Cao, W., et al, Mater. Chem. Phys. 158 2015) p. 89.CrossRefGoogle Scholar
[6] Shi, X., et al, Crystals 8 2018 24.Google Scholar
[7] Kroll, T., et al, J. Chem. Phys. 137 2012 054306.Google Scholar
[8] The authors acknowledge funding from the European Commission's Seventh Framework Programme (FP7/2007-2013) CALIPSO (Grant No. 312284). X.S. thanks the scholarship sponsored by China Scholarship Council. J.H., J.-Cl.D. and F.Z. acknowledge the financial support of the Swiss National Science Foundation (Grant No. 200020_146739).Google Scholar