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Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages

Published online by Cambridge University Press:  23 September 2015

Claude Merlet
Claude Merlet*
Affiliation:
GM, CNRS, Universite de Montpellier, Place E. Bataillon, 34095 Montpellier, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1439 - 1440
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Merlet, C. & Llovet, X., IOP Conf. Ser. Mater. Sci. Eng 32 (2012) p 012016.CrossRefGoogle Scholar
[2] Gauvin, R., Hovington, P. & Drouin, D., Scanning 17 (1995) p 202.Google Scholar
[3] Arnould, O. & Hild, F., X-Ray Spectrometry 32 (2003) p 345.Google Scholar
[4] Merlet, C., Mikrochnmca Acta 114/115 (1994) p 363.CrossRefGoogle Scholar
[5] Llovet, X. & Merlet, C., Micros. Microanal 16 (2010) p 21.Google Scholar
[6] Armstrong, J. T. & Buseck, P. R., Anal. Chem 47 (1975) p 2148.Google Scholar
[7] Kalfoun, F., Ionov, D. & Merlet, C., Earth Planet. Sci. Lett 199 (2002) p 49.Google Scholar